Rovensky, Yu.A. et al. (1980)
Rovensky, Yu.A., Gvichyia, A.S., and Vasiliev, J.M. (1980) Scan. Electron Microsc. 1980, Vol. 3, Scan. Electron Microscopy, Inc., AMF O'Hare, Chicago, pp. 71-78.
Rovensky, Yu.A., Gvichyia, A.S., and Vasiliev, J.M. (1980) Scan. Electron Microsc. 1980, Vol. 3, Scan. Electron Microscopy, Inc., AMF O'Hare, Chicago, pp. 71-78.
